Bruker Discover-8

Location

Center for Discovery and innovations (CDI), Room: 4.228
The City College of New York
85 St Nicholas Terrace, New York, NY 10031

Staff

Alexei Bykov, Ph.D.
abykov@ccny.cuny.edu
Phone: 212 650 5548.
Cell: 646 725 0270

Scheduling and Fees

Contact facility manager for details

Facility Images

About the facility

The Bruker Discover-8 diffraction system utilizing point 0-D scintillation counter, linear 1-D position sensitive (LINXEYE), and area 2-D (VANTEC-500) detectors offers a variety of capabilities by using both high resolution (HR) and powder diffraction (PD) configurations.  The HR configuration with scintillator counter and position sensitive detectors is applied for thin films characterization by measuring rocking curves, precision 2Theta - Omega scans, reciprocal space mapping.  Available HR techniques also include high resolution pole figures measurements for texture analysis and film thickness measurements by reflectivity.  PD configuration comprises unique large area VANTEC-500 detector. This configuration is excellent tool for phase identification of powder samples, single crystal orientation, minerals and rocks study (phase identification by microdiffraction), fast texture measurements (pole figures).

System Specification:

Generator: Voltage - 40kV; Current - 40mA

Cu X-ray Tube: Sealed ceramic tube with Line Focus

Operating Mode: Parallel beam, Theta/Theta (fixed sample)

Sample stage: Centric Eulerian Cradle with motorized Chi tilt, Phi rotation, and X-Y-Z translations.

Laser/video System: Computer controlled video camera and laser pointer for easy and accurate sample positioning and system alignment

Incident beam optics: Göbel Mirror, 2-bounce Germanium monochromator, incident beam slits, pinholes, auto-absorber, collimators

Diffracted beam optics: Motorized receiving slit and Pathfinder module with computer controlled diffracted beam configurations (motorized slit, soller slit, crystal analyzer)

Detectors: 0-D (scintillation counter) - for high resolution measurements;

1-D (LINXEYE) - for fast measurements (silicon strip technology, 192 channels, covers 14.4x16 mm²);

2-D VANTEC-500 - for collection all information in one shot (135 mm in diameter with 4,000,000 channels)

Operational software:

Diffraction suit – data acquisition (Commander) and system control (hardware status and configuration) toolbox.

Evaluation software:

Leptos – high resolution diffraction data;

Eva - phase analysis;

Multex – texture analysis;

Topas - profile and structure analysis.